弯曲半径
波导管
材料科学
光学
硅
宽带
半径
带宽(计算)
光电子学
插入损耗
硅光子学
光子集成电路
光子学
弯曲
物理
电信
计算机科学
复合材料
计算机安全
作者
Zhekang Zhang,Yuchen Shi,Bo Shao,Taotao Zhou,Fan Luo,Yin Xu
出处
期刊:Photonics
[Multidisciplinary Digital Publishing Institute]
日期:2022-08-30
卷期号:9 (9): 616-616
被引量:13
标识
DOI:10.3390/photonics9090616
摘要
Waveguide bend is an indispensable component in the on-chip compact photonic integrated circuits (PICs) and the minimum bend size greatly limits the increase of integration density of PICs. Here, we propose broadband and low-loss silicon waveguide bend schemes using air trenches on both sides and embedded germanium arc in the inner side of waveguide bend. Using these ways, the silicon waveguide bending radius can be greatly reduced to less than 500 nm and the obtained insertion loss (IL) can be as low as 0.12 dB compared with IL = 1.73 dB obtained by direct silicon waveguide bend under the same bending radius. Meanwhile, the working bandwidth can be extended over 500 nm covering the whole optical communication band by keeping IL < 0.5 dB. Therefore, the proposed device schemes could push the development of on-chip PICs toward higher integration density.
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