钝化
电致发光
发光二极管
原子层沉积
光电子学
二极管
光致发光
材料科学
可见光通信
量子效率
电子工程
图层(电子)
纳米技术
工程类
作者
Shouqiang Lai,Tingwei Lu,Su-Hui Lin,Yi Lin,Guo‐Chun Lin,Jian-Hua Pan,Yue-Long Zhuang,Yijun Lü,Yue Lin,Hao‐Chung Kuo,Zhong Chen,Tingzhu Wu
标识
DOI:10.1109/ted.2022.3188738
摘要
By adopting atomic layer deposition (ALD) sidewall passivation, the electroluminescence (EL) and communication performances of mini-light emitting diodes (mini-LEDs) of different sizes were improved. In particular, the most significant improvement in the electroluminescence properties of the external quantum efficiency (EQE) (a 7.2% increase), leakage current, and the communication properties of the modulation bandwidth (a 20% increase) transmission rate and bit error rate (BER) was found in the smallest mini-LEDs (80$\mu \text{m}\,\,\times $120$\mu \text{m}$). According to the results of time-resolved photoluminescence (TRPL) measurements, the carrier lifetime of the samples can be affected by both the size and ALD sidewall passivation. In addition, the effects of ALD sidewall passivation for visible-light communication (VLC) were demonstrated.
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