各向异性
材料科学
铼
色阶
方向(向量空间)
光谱学
光学
反射率
Crystal(编程语言)
工作(物理)
光电子学
计算机科学
物理
几何学
数学
量子力学
冶金
热力学
程序设计语言
作者
Ting Wen,Jing Li,Qingyang Deng,Chenyin Jiao,Maodi Zhang,Song Wu,Lin Lin,Wen Huang,Juan Xia,Zenghui Wang
出处
期刊:Small
[Wiley]
日期:2022-03-21
卷期号:18 (17)
被引量:8
标识
DOI:10.1002/smll.202108028
摘要
In-plane anisotropy in 2D rhenium disulfide (ReS2 ) offers intriguing opportunities for designing future electronic and optical devices, and toward such applications, it is crucial to identify the crystal orientation in such 2D anisotropic materials. Existing spectroscopy or electron microscopy methods for determining the crystalline orientation often require complicated sample preparing procedures and specialized equipment, which could sometimes limit their application. In this work, a dichromatic polarized reflectance method is demonstrated, which can quickly and accurately resolve the crystal orientation (Re-Re chain) in 2D ReS2 crystals with different thicknesses. Furthermore, it can be readily extended to multi-chromatic schemes to achieve greater measurement capability and can be easily tailored to work for different 2D materials. The method offers a simple and effective approach for studying anisotropy in 2D materials.
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