紫外光电子能谱
X射线光电子能谱
材料科学
有机半导体
偶极子
费米能级
紫外线
电荷(物理)
金属
光电发射光谱学
富勒烯
原子物理学
化学物理
光电子学
分析化学(期刊)
化学
核磁共振
物理
有机化学
量子力学
色谱法
冶金
电子
作者
Z. B. Wang,Michael G. Helander,Mark Greiner,Jacky Qiu,Zheng‐Hong Lu
摘要
The energy-level alignment and charge injection at metal/C60/organic interfaces have been studied by ultraviolet photoelectron spectroscopy and temperature dependent current-voltage (IV) measurements. It is found that the Fermi level at the interface is pinned to ∼4.7eV by adsorbed C60 molecules on the metal surface, resulting in more favorable energy level alignment for charge injection. The findings are in excellent agreement with interface dipole theory derived from traditional semiconductor physics.
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