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计算机科学
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作者
S. Niedermeier,H. Schillinger,R. Sauerbrey,B. Adolph,F. Bechstedt
摘要
We report simultaneous measurements and ab initio calculations of the second-order nonlinear coefficients for SiC polytypes. Our measured values for χzzz (χzxx) are 18 (−4) pm/V for 4H SiC and 24 (−4) pm/V for 6H SiC. They are in good agreement with our theoretical results.
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