X射线光电子能谱
佩多:嘘
工作职能
氧化铟锡
紫外光电子能谱
材料科学
基质(水族馆)
接触角
薄膜
光电发射光谱学
化学工程
旋涂
单层
图层(电子)
纳米技术
复合材料
工程类
地质学
海洋学
作者
Di Wu,Shanshan Wan,Tianyu Zhai,Jiacheng Yang,Rongbin Wang,Steffen Duhm
标识
DOI:10.1002/pssr.202100434
摘要
Ultraviolet and X‐ray photoelectron spectroscopy (UPS and XPS) are used to investigate the impact of surface hydrophobicity on the work function of spin‐coated poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) thin films. Although O 2 –plasma or UV–ozone treatment of indium tin oxide (ITO) changes the substrate hydrophobicity, the work functions of subsequently spin‐coated PEDOT:PSS layers are not affected and stay constant at around 5 eV. ITO modification by a self‐assembled monolayer of p ‐(trifluoromethyl)phenylphosphonic acid leads to a pronounced contact angle of 90°, resulting in a PSS‐rich PEDOT:PSS surface (as shown by XPS) and a work function of 5.15 eV (as shown by ultraviolet photoelectron spectroscopy). This can be rationalized by an increased bulk chemical potential of PEDOT:PSS.
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