Chemical characterization of SiC N nanolayers by FTIR-and Raman spectroscopy, XPS and TXRF-NEXAFS
作者
Olaf Baake,Н. И. Файнер,P. Hoffmann,M. L. Kosinova,Yu. M. Rumyantsev,В. А. Трунова,Andreas Klein,Wolfgang Ensinger,Beatrix Pollakowski,Burkhard Beckhoff,G. Ulm