光学
材料科学
剪切(物理)
干扰(通信)
薄膜
折射率
光电子学
物理
计算机科学
电信
复合材料
频道(广播)
纳米技术
作者
Supannee Learkthanakhachon,Suejit Pechprasarn,Michael G. Somekh
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2018-11-20
卷期号:43 (23): 5797-5797
被引量:4
摘要
A lateral shearing interferometric technique combined with an 11.6 μm polydimethylsiloxane (PDMS) transparent thin film is proposed and demonstrated for optical detection of ultrasound. We experimentally report the device change of reflectivity with pressure of 5.1×10-7 Pa-1, 9.5 times more sensitive than the critical-angle-based sensor, 31 times more sensitive than the surface-plasmon-based sensor, and comparable to the Fabry-Perot sensor. The objective-lens-based angle scanning characterization setup inspired from a laser scanning system allows direct comparison between the PDMS sensor and critical-angle-based sensor by adjusting the incident angle with a scanning mirror, thereby eliminating optical and electronics system dependence. The sensing element is easily fabricated through spin coating and the detection element incorporated into an existing optical system with minimum modification.
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