铌
氧化铌
五氧化二铌
自然键轨道
材料科学
氧化物
化学计量学
GSM演进的增强数据速率
分析化学(期刊)
化学
物理化学
计算化学
冶金
密度泛函理论
计算机科学
电信
色谱法
作者
Dieter Bach,Heike Störmer,Reinhard Schneider,D. Gerthsen,Johan Verbeeck
标识
DOI:10.1017/s1431927606060521
摘要
Electron energy loss spectra in conjunction with near-edge fine structures of purely stoichiometric niobium monoxide (NbO) and niobium pentoxide (Nb 2 O 5 ) reference materials were recorded. The structures of the niobium oxide reference materials were checked by selected area electron diffraction to ensure a proper assignment of the fine structures. NbO and Nb 2 O 5 show clearly different energy loss near-edge fine structures of the Nb-M 4,5 and -M 2,3 edges and of the O-K edge, reflecting the specific local environments of the ionized atoms. To distinguish the two oxides in a quantitative manner, the intensities under the Nb-M 4,5 as well as Nb-M 2,3 edges and the O-K edge were measured and their ratios calculated. k -factors were also derived from these measurements.
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