材料科学
基质(水族馆)
半导体
光电子学
带隙
图层(电子)
异质结
钻石
氧化物
无定形固体
纳米技术
直接和间接带隙
复合材料
冶金
化学
结晶学
海洋学
地质学
作者
Takashi Matsumae,Hitoshi Umezawa,Yuichi Kurashima,Hideki Takagi
出处
期刊:ECS transactions
[Institute of Physics]
日期:2023-05-19
卷期号:111 (2): 53-60
被引量:2
标识
DOI:10.1149/11102.0053ecst
摘要
For the next-generation semiconductor devices, our research group has developed direct bonding techniques of wide-bandgap materials, including SiC, Ga 2 O 3 , and diamond. It is known that the semiconductor substrates activated by oxygen plasma can form atomic bonds at low temperatures. In this case, a thick oxide layer, which may become a thermal and electrical barrier, is formed at the bonding interface. Meanwhile, our research group demonstrated that the OH-terminated Ga 2 O 3 and diamond substrates were directly bonded without an oxide intermediate layer. In addition, the SiC substrate dipped into the HF acid can be bonded with the Ga 2 O 3 substrate with an ~1-nm-thick amorphous layer. The dissimilar substrates bonded through the ultra-thin intermediate layer would contribute to efficient heat dissipation and future heterojunction devices.
科研通智能强力驱动
Strongly Powered by AbleSci AI