桥(图论)
灵活性(工程)
频道(广播)
过程(计算)
计算机科学
电气工程
工程类
电子工程
数学
操作系统
医学
统计
内科学
作者
Jaehun Jeong,Sang Hyeon Lee,S. Masuoka,Shincheol Min,Sanghoon Lee,Seungkwon Kim,Taehun Myung,Byung-Ha Choi,Chang-Woo Sohn,Sung Won Kim,Jeongmin Choi,Jungmin Park,Hyung-Jong Lee,Taeyoung Kim,Seokhoon Kim,Yuri Yasuda-Masuoka,Ja-Hum Ku,Gitae Jeong
标识
DOI:10.23919/vlsitechnologyandcir57934.2023.10185353
摘要
In this paper, 3nm Gate-All-Around technology (SF3) having more advanced 2 nd generation of Multi-Bridge-Channel FET (MBCFET™) has been demonstrated with additional process optimization from $1 ^{st}$ generation GAA device (SF3E) already in mass production [1]. As a result, SF3 platform successfully has 22% speed, 34% power gain and 0.79x logic area over our previous 4nm FinFET platform [2] with additional design flexibility using various nano-sheet(NS) widths of MBCFET™ device in the same cell type.
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