Time-Efficient Preparation of Perovskite Thick Films via Vacuum-Assisted Hot-Pressing for X-ray Detectors

Although perovskite thick films prepared via solution-based methods have demonstrated promising properties for X-ray detectors, their annealing at high temperatures typically requires several hours, limiting the time-efficiency of production. In addition, we find that the surface of perovskite thick films tends to preferentially form a dense shell, which hinders the evaporation of the internal solvent and prolongs the annealing time. Herein, we demonstrate a vacuum-assisted hot-pressing (VHP) strategy that alters the evaporation path and rate of the solvent through the synergism of pressure, vacuum, and heating. This approach not only reduces the annealing time from 8 to 1 h, which is one of the shortest annealing durations reported so far, but enhances the crystallization homogeneity and compactness of perovskite thick films. As such, the VHP-processed X-ray detectors exhibit a sensitivity of 1.13 × 104 μC Gyair–1 cm–2, accompanied by an impressive imaging capability with a spatial resolution of 2.5 lp mm–1. Our findings present an avenue for time-efficient production to improve both the quality of thick films and the performance of X-ray detectors.