材料科学
光电子学
焊接
炸薯条
碳化硅
可靠性(半导体)
电子工程
热的
功率(物理)
功率半导体器件
温度循环
倒装芯片
MOSFET
功率MOSFET
锡膏
电气工程
工程物理
动力循环
互连
随时间变化的栅氧化层击穿
热阻
电子包装
降级(电信)
集成电路封装
模具(集成电路)
热导率
温度测量
作者
Nick Baker,Szymon Bęczkowski,Kjeld Pedersen,Asger Bjørn Jørgensen,Kaichen Zhang,Stefan Meyer,Francesco Iannuzzo,Arthur Boutry
标识
DOI:10.1109/ecce58356.2025.11259945
摘要
This paper uses a below room-temperature Gallium-based liquid-metal paste for chip-level packaging of SiC MOSFETs. All chip critical interconnects (die-attach, topside, and gate connections) are implemented using liquid-metal. We evaluate five liquid-metal packaged SiC MOSFETs against three conventional Solder and Wirebonded SiC MOSFETs. The liquid-metal versions show improved thermal performance and an increased power cycling performance by a factor of 10x. Notably, the liquid-metal pastes are contained without the use of any encapsulation.
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