电介质
表面粗糙度
散射
兰姆达
雷达
材料科学
含水量
基本事实
光学
遥感
计算物理学
物理
地质学
光电子学
计算机科学
电信
岩土工程
机器学习
复合材料
作者
Yisok Oh,Kamal Sarabandi,F.T. Ulaby
摘要
Polarimetric radar measurements were conducted for bare soil surfaces under a variety of roughness and moisture conditions at L-, C-, and X-band frequencies at incidence angles ranging from 10 degrees to 70 degrees . Using a laser profiler and dielectric probes, a complete and accurate set of ground truth data was collected for each surface condition, from which accurate measurements were made of the rms height, correlation length, and dielectric constant. Based on knowledge of the scattering behavior in limiting cases and the experimental observations, an empirical model was developed for sigma degrees /sub hh/, sigma degrees /sub vv/, and sigma degrees /sub hv/ in terms of ks (where k=2 pi / lambda is the wave number and s is the rms height) and the relative dielectric constant of the soil surface. The model, which was found to yield very good agreement with the backscattering measurements of the present study as well as with measurements reported in other investigations, was used to develop an inversion technique for predicting the rms height of the surface and its moisture content from multipolarized radar observations.>
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