InAs electron avalanche photodiodes with single carrier type multiplication and extremely low excess noise
作者
Andrew R J Marshall,Chee Hing Tan,Matthew J. Steer,J.P.R. David
标识
DOI:10.1109/leos.2008.4688607
摘要
This paper reports a comprehensive study of impact ionization in InAs avalanche photodiodes (APDs), indicating for the first time that InAs may offer a III-V alternative to the CdHgTe electron APD (EAPD).