The detective quantum efficiency of CCD and vidicon-based detectors for X-ray crystallographic applications

The detective quantum efficiency (DQE) characterizes the measurement uncertainty introduced by a detector. A formulation of the DQE for CCD and vidicon-based X-ray integrating detectors is developed and illustrated with five model detectors. A comparison of the calculated and measured DQEs for two of these detectors is presented. From an examination of the DQEs for the model detectors, generalizations are made regarding detector designs.