A Benchmark Characterization of the EEMBC Benchmark Suite
作者
Jason A. Poovey,Thomas Martin Conte,Markus Levy,Shay Gal-On
出处
期刊:IEEE Micro [Institute of Electrical and Electronics Engineers] 日期:2009-09-01卷期号:29 (5): 18-29被引量:216
标识
DOI:10.1109/mm.2009.74
摘要
Benchmark consumers expect benchmark suites to be complete, accurate, and consistent, and benchmark scores serve as relative measures of performance. however, it is important to understand how benchmarks stress the processors that they aim to test. this study explores the stress points of the EEMBC embedded benchmark suite using the benchmark characterization technique.