材料科学
等离子体
薄膜
沉积(地质)
溅射沉积
氩
基质(水族馆)
溅射
蒙特卡罗方法
半导体
光电子学
分析化学(期刊)
原子物理学
纳米技术
化学
物理
沉积物
古生物学
地质学
海洋学
统计
生物
数学
色谱法
量子力学
标识
DOI:10.3103/s1068335623010037
摘要
The impact of plasma temperature as a sputtering deposition parameter on the thin film morphology has been studied using a Monte Carlo (MC) simulation model. The plasma gas was argon (Ar), while three materials (Cu, SiO2, and GaN) represented conductors, insulators, and semiconductors were used as targets. The model estimates the flow of ejected atoms as they reach the substrate, their energy, and their positions. Furthermore, while investigating the deposition rates of the material atoms, the influence of the gas temperature factor inside the vacuum chamber on magnetron deposition performance and hence the quality of the obtained films were explored.
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