悬空债券
硅
扫描隧道显微镜
数码产品
纳米技术
材料科学
Atom(片上系统)
应变硅
原子单位
工程物理
光电子学
晶体硅
电气工程
计算机科学
物理
工程类
嵌入式系统
量子力学
非晶硅
作者
Jason Pitters,Jeremiah Croshaw,Roshan Achal,Lucian Livadaru,S. H. Ng,Robert Lupoiu,Taras Chutora,Taleana Huff,Konrad Walus,Robert A. Wolkow
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-02-20
卷期号:18 (9): 6766-6816
被引量:32
标识
DOI:10.1021/acsnano.3c10412
摘要
Atomically precise manufacturing (APM) is a key technique that involves the direct control of atoms in order to manufacture products or components of products. It has been developed most successfully using scanning probe methods and has received particular attention for developing atom scale electronics with a focus on silicon-based systems. This review captures the development of silicon atom-based electronics and is divided into several sections that will cover characterization and atom manipulation of silicon surfaces with scanning tunneling microscopy and atomic force microscopy, development of silicon dangling bonds as atomic quantum dots, creation of atom scale devices, and the wiring and packaging of those circuits. The review will also cover the advance of silicon dangling bond logic design and the progress of silicon quantum atomic designer (SiQAD) simulators. Finally, an outlook of APM and silicon atom electronics will be provided.
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