互连
材料科学
薄脆饼
接触电阻
电接点
变形(气象学)
数据清理
纳米技术
复合材料
光电子学
计算机科学
图层(电子)
计算机网络
操作系统
作者
Chaoqi Zhang,Hyung Suk Yang,Hiren Thacker,Ivan Shubin,J. E. Cunningham,Muhannad S. Bakir
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2016-10-26
卷期号:6 (11): 1587-1594
被引量:8
标识
DOI:10.1109/tcpmt.2016.2614997
摘要
A wafer-level, batch-fabricated, mechanically flexible interconnect (MFI) with a contact tip has been developed for rematable heterogeneous system integration. The contact tip, which exhibits a truncated-cone profile, enhances the scrubbing capability while maintaining the tip lifetime by avoiding tip plastic deformation. Electrical and mechanical characterization has been conducted on various testbeds to verify the performance of the assembled chip links with MFIs. The results indicate that a single MFI has an average electrical resistance of 103.21 mQ and up to 1 A current carrying capability, and can be successfully assembled on nonplanar surfaces with up to 45-μm surface variation.
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