极紫外光刻
极端紫外线
材料科学
透射电子显微镜
衍射
紫外线
光学
光电子学
图层(电子)
纳米技术
物理
激光器
作者
Jennifer Rebellato,Regina Soufli,Evgueni Meltchakov,Eric M. Gullikson,Sébastien de Rossi,Cédric Baumier,F. Pallier,Franck Delmotte
标识
DOI:10.1016/j.tsf.2021.138873
摘要
This manuscript presents the structural characterization of Al/Sc-based periodic multilayer coatings for the extreme ultraviolet (EUV) spectral range. Based on transmission electron microscopy and electron diffraction as well as grazing-incidence and large-angle x-ray diffraction, a model for the layer structure and the interfacial effects of Al/Sc coatings is built. The onset of crystallization in nanoscale Al and Sc layers as a function of thickness is also revealed in these characterizations. The Al/Sc layer model is validated and further refined by fitting in-band and out-of-band EUV reflectance measurements across 5 orders of magnitude in an extended wavelength range from 17 to 80 nm. The same type of EUV reflectance measurements is used to test the Al/Sc aging properties and to demonstrate the spectral response of optimized two- and tri-material multilayers including Al/Sc, Al/Sc/SiC and Mo/Al/Sc.
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