蚀刻(微加工)
硅
反应离子刻蚀
等离子体
等离子体刻蚀
材料科学
过程(计算)
深反应离子刻蚀
各向同性
各向同性腐蚀
纳米技术
光电子学
计算机科学
物理
光学
操作系统
量子力学
图层(电子)
作者
Andrey V. Miakonkikh,Sergey Averkin,K. V. Rudenko,В. Ф. Лукичев
摘要
Present paper overviews existent and newly developed DSE technologies offering optimal choice for specific demands. Under consideration there are four types of deep silicon etching processes: cyclic original Bosch process and modified one, continuous cryoetch process, cyclic STiGer process, and new Ox-Etch process. All processes designed with fluorine chemistry of SF6 based plasma that provides fastest etch reaction with Silicon enhanced by ion bombardment from plasma. The differences are in approach used to suppress the isotropic etching of the structure sidewalls to achieve required anisotropy and of etch process.
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