介观物理学
接触力
刚度
振幅
原子力显微镜
原子力声学显微镜
耗散系统
接触力学
物理
经典力学
机械
缩放比例
光学
统计物理学
材料科学
纳米技术
磁力显微镜
凝聚态物理
数学
几何学
量子力学
有限元法
热力学
磁场
磁化
作者
Pius M. Theiler,Christian Ritz,Andreas Stemmer
摘要
Force–distance curves recorded by frequency modulated atomic force microscopy (FM AFM) provide insight into the tip–sample mechanics. For quantitative analysis, FM AFM is able to separate conservative from dissipative forces by simultaneously measuring amplitude–distance and frequency–distance curves. Here, we report on the conservative forces in the gentle tip–sample contact of mesoscopic tips at low Tabor parameters. We introduce an analytical expression for the frequency shift based on the Derjaguin–Muller–Toporov (DMT) contact model to simplify the comparison between the experiment and theory. From the analytical formulas, a scaling law between the tip radius and minimal frequency shift is found, which is supported by experimental data. Although excellent fits for full frequency–distance curves are possible, the resulting material properties do not match the accepted literature values. We suspect that these flaws are a consequence of the incomplete treatment of attractive forces and DMT’s strain-stiffness approximation, rendering DMT-based models inappropriate to measure material properties by dynamic AFM in gentle contact.
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