X射线光电子能谱
分子束外延
外延
材料科学
薄膜
兴奋剂
蒸发
光电子学
分析化学(期刊)
衍射
纳米技术
化学工程
光学
化学
图层(电子)
色谱法
工程类
物理
热力学
作者
Kevin Ruwisch,Tobias Pohlmann,Florian Bertram,Christoph Schlüter,A. Gloskovskii,Karsten Küpper,J. Wollschläger
出处
期刊:Materials
[Multidisciplinary Digital Publishing Institute]
日期:2022-03-23
卷期号:15 (7): 2377-2377
被引量:1
摘要
In this work, we present a comprehensive study on real-time monitoring the growth of epitaxial CoxFe3−xO4 thin films grown on SrTiO3(001) substrates via reactive molecular beam epitaxy. The growth process was monitored during evaporation by means of time resolved operando hard X-ray photoelectron spectroscopy (HAXPES). We prepared ultrathin ferrite films using different oxygen partial pressures, showing pure metallic, light oxidic, and cobalt ferrite-like growth. Additional X-ray diffraction measurements confirm HAXPES results.
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