Simplifying BRDF input data for optical signature modeling

Scene simulations of optical signature properties using signature codes normally requires input of various parameterized measurement data of surfaces and coatings in order to achieve realistic scene object features. Some of the most important parameters are used in the model of the Bidirectional Reflectance Distribution Function (BRDF) and are normally determined by surface reflectance and scattering measurements. Reflectance measurements of the spectral Directional Hemispherical Reflectance (DHR) at various incident angles can normally be performed in most spectroscopy labs, while measuring the BRDF is more complicated or may not be available at all in many optical labs. We will present a method in order to achieve the necessary BRDF data directly from DHR measurements for modeling software using the Sandford-Robertson BRDF model. The accuracy of the method is tested by modeling a test surface by comparing results from using estimated and measured BRDF data as input to the model. These results show that using this method gives no significant loss in modeling accuracy.