雪崩光电二极管
紫外线
光电子学
金属有机气相外延
光电二极管
材料科学
二极管
APDS
暗电流
波长
光学
光电探测器
物理
外延
纳米技术
探测器
图层(电子)
作者
Shyh‐Chiang Shen,Yun Zhang,Dongwon Yoo,Jae-Boum Limb,Jae‐Hyun Ryou,P. Douglas Yoder,Russell D. Dupuis
标识
DOI:10.1109/lpt.2007.906052
摘要
We report high-performance GaN ultraviolet (UV) p-i-n avalanche photodiodes (APDs) fabricated on bulk GaN substrates. The fabricated GaN p-i-n diodes demonstrated optical gains $>10^{4}$ and low dark current densities operating at wavelengths from 280 to 360 nm. The result is among the highest III–N-based APD gains at the deep UV wavelength of 280 nm reported to date.
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