纳米压痕
纳米线
材料科学
硅
弹性模量
纳米化学
纳米技术
刚度
硅纳米线
模数
纳米尺度
原子力显微镜
复合材料
光电子学
作者
Young-Soo Sohn,Jinsung Park,Gwonchan Yoon,Jiseok Song,Sang‐Won Jee,Jung‐Ho Lee,Sungsoo Na,Taeyun Kwon,Kilho Eom
标识
DOI:10.1007/s11671-009-9467-7
摘要
Nanowires have been taken much attention as a nanoscale building block, which can perform the excellent mechanical function as an electromechanical device. Here, we have performed atomic force microscope (AFM)-based nanoindentation experiments of silicon nanowires in order to investigate the mechanical properties of silicon nanowires. It is shown that stiffness of nanowires is well described by Hertz theory and that elastic modulus of silicon nanowires with various diameters from ~100 to ~600 nm is close to that of bulk silicon. This implies that the elastic modulus of silicon nanowires is independent of their diameters if the diameter is larger than 100 nm. This supports that finite size effect (due to surface effect) does not play a role on elastic behavior of silicon nanowires with diameter of >100 nm.
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