High Angle Dark Field Imaging of Two-Dimensional Crystals

Two-dimensional (2D) materials, graphene, hexagonal boron nitride (h-BN) and transition metal dichalcogenides (TMD) have been investigated by means of Scanning Transmission Electron Microscopy (STEM), in particular via High Angle Annular Dark Field (HAADF) imaging technique. They are compared in terms of their structure and durability under intense electron beams.