比较器
CMOS芯片
逐次逼近ADC
计算机科学
偏移量(计算机科学)
电子工程
放大器
电压
输入偏移电压
电气工程
工程类
运算放大器
程序设计语言
作者
Xiyuan Tang,Long Chen,Jeonggoo Song,Nan Sun
标识
DOI:10.1109/esscirc.2016.7598329
摘要
This paper presents a 10-bit high-speed two-stage SAR ADC. Each bit uses a dedicated comparator to store its output and generate an asynchronous clock for the next comparison. By doing this, the SAR logic delay and power are significantly reduced. A modified bidirectional single-side switching technique is used to optimize the comparator speed and offset by controlling the input common mode voltage V cm . To suppress the comparator offset mismatch induced nonlinearity, redundancy and a shared pre-amplifier are employed in the second fine stage. The pre-amplifier is implemented using a dynamic latch to avoid static power consumption. The prototype ADC in 40-nm CMOS achieves 55dB peak SNDR at 200MS/s sampling rate without any calibration. It consumes 750µW from 1.1V power supply, leading to a Walden FOM of 8.6fJ/conversion-step.
科研通智能强力驱动
Strongly Powered by AbleSci AI