等离子体增强化学气相沉积
钝化
材料科学
太阳能电池
薄脆饼
饱和电流
氧化物
硅
光电子学
化学工程
纳米技术
图层(电子)
电压
电气工程
冶金
工程类
作者
Shuai Ma,Baochen Liao,Fei Qiao,Dong Ding,Chao Gao,Zhengping Li,Rui Tong,Xiangyan Kong,Wenzhong Shen
标识
DOI:10.1016/j.solmat.2023.112396
摘要
Tunnel oxide passivated contact (TOPCon) solar cells have gradually dominated the industrial silicon solar cells. In this paper, we have adopted the tube plasma-enhanced chemical vapor deposition (PECVD) technology integrating with nano SiOx (Tox) and in-situ phosphorus-doped polysilicon (n + poly-Si), in which Tox is prepared by plasma-assisted oxygen (O2) oxidation. Passivation and contact performance of TOPCon solar cells have been investigated under different thicknesses of Tox, and the following simulation has confirmed the optimal electrical properties, i.e., the implied open-circuit voltage (iVOC) of the hydrogenated lifetime sample is promoted to more than 736.1 mV on the textured wafer, corresponding to a lowest single-sided saturation current density (J0) of 4.6 fA/cm2, and the contact resistivity of 1.55 mΩ cm2 extracted from the transmission line method. Characterizations are carried out to conform the rear stack passivation layers satisfy the requirement of the high-efficiency TOPCon solar cells. Finally, we have fabricated the large-sized TOPCon solar cells with an average efficiency of 24.5% and a maximum efficiency of 24.7%, respectively. The above work has demonstrated the tube PECVD technology integrating with plasma-assisted O2 oxidation and in-situ doped poly-Si has the potential for the mass-production TOPCon in industry.
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