电子背散射衍射
材料科学
晶界
微观结构
剪切带
Crystal(编程语言)
方向错误
冶金
剪切(地质)
衍射
粒度
凝聚态物理
结晶学
复合材料
光学
化学
程序设计语言
物理
计算机科学
作者
Dorothée Dorner,Yoshitaka Adachi,Kaneaki Tsuzaki
标识
DOI:10.4028/www.scientific.net/msf.558-559.873
摘要
Compression tests were performed on Fe-3%Si specimens with few grains. The deformation microstructure and microtexture were investigated by electron backscatter diffraction (EBSD) and related to the initial crystal orientation and grain boundary characteristics. Groups of microbands were found that are characterised by a periodic change in crystal orientation, shear at the grain boundary, and the formation of new grains. It is supposed that these microband groups represent an early stage of microshear band development.
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