材料科学
塞贝克系数
电阻率和电导率
碲化铋
热电效应
分析化学(期刊)
兴奋剂
Crystal(编程语言)
扫描电子显微镜
掺杂剂
结晶学
热导率
化学
光电子学
物理
电气工程
色谱法
计算机科学
工程类
复合材料
热力学
程序设计语言
作者
Ganesh Shridhar Hegde,A. N. Prabhu,M. K. Chattopadhyay
标识
DOI:10.1007/s10854-021-06946-8
摘要
Abstract In the current work, growth and thermoelectric characterization of tin and selenium co-doped single crystal bismuth telluride have been carried out in the range of temperature 10–400 K. The crystals show hexagonal crystal structure with R $$\overline{3 }$$ 3 ¯ m space group . The direction of growth, quality of the single crystals, the density of dislocation, and dopants effect on the inner plane structure of the crystals have been analyzed through high-resolution X-ray diffraction study. Energy dispersive analysis of X-rays approves the elemental composition, and field emission scanning electron microscopy shows uniform growth with micro precipitates on the surface of the crystals. Quasi degenerate and non-degenerate electrical resistivity is observed in the pristine and doped samples, respectively. Temperature-dependent Seebeck coefficient measurements confirm the n -type semiconducting nature of the pristine as well as doped samples. Temperature-dependent power factor of (Bi 0.96 Sn 0.04 ) 2 Te 2.7 Se 0.3 is found to increase by 1.1 times, and electrical resistivity reduced by 3.3 times as compared to pristine Bi 2 Te 3 .
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