物理
锗
相变
相(物质)
凝聚态物理
工程物理
硅
光电子学
量子力学
作者
Helmut Olijnyk,S. K. Sikka,Wilfried B Holzapfel
标识
DOI:10.1016/0375-9601(84)90219-6
摘要
The crystal structures of Si and Ge were studied by energy dispersive X-ray diffraction at room temperature and pressures up to 50 GPa. Si transforms to a primitive hexagonal (Si-V) structure around 16 GPa, to an intermediate phase Si-VI between 35 and 40 GPa, and to hcp (Si-VII) around 40 GPa. In contrast, Ge remains in the β-tin structure up to at least 51 GPa. The pseudopotential method reproduces these differences in the high-pressure behavior of Si and Ge.
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