结晶度
化学
拉曼光谱
吸收(声学)
薄膜
图层(电子)
胺气处理
带隙
化学工程
相(物质)
分析化学(期刊)
纳米技术
光电子学
材料科学
复合材料
光学
结晶学
有机化学
物理
工程类
作者
Yanqing Liu,Yanchun Yang,Junting Ren,Guonan Cui,Xin Zhao,Rui Wang,Lulu Bai,Chengjun Zhu
标识
DOI:10.1016/j.arabjc.2024.105839
摘要
Cu3VSe4 material has become a new kind of photovoltaic absorber due to its optical bandgap matching light-absorbing, abundant elements in crust, and high light absorption coefficient. Here, we prepared Cu3VSe4 thin films by amine-thiol method and investigated the preparation process of excellent Cu3VSe4 absorption layer for the first time. The effects of various Cu/V ratios on the morphology, structure, and electrical properties of the films are studied. XRD and Raman results show that pure-phase Cu3VSe4 films are obtained with the Cu/V ratios lower than 2.9. SEM results simply adjusting the Cu/V ratio cannot obtain a compact selenized Cu3VSe4 thin films. The best crystallinity of thin film with 2.8 of Cu/V ratio is named as Cu2.8VSe4 and selected as the representative. Though optimizing the selenization conditions, a dense morphology and good electrical properties of the absorption layer can be prepared under 570 °C of the high-temperature process. Our findings can lay the favorable foundation for high-efficiency Cu3VSe4 devices.
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