光探测
材料科学
光电子学
光电流
带隙
光电探测器
光电导性
肖特基势垒
异质结
兴奋剂
薄膜
纳米技术
二极管
作者
Le Zhang,Bing Wang,Yongheng Zhou,Cong Wang,Xiaolong Chen,Han Zhang
标识
DOI:10.1002/adom.202000045
摘要
Abstract Black phosphorus (BP), a van der Waals (vdW) layered material, has been intensively studied in recent years since the rediscovery of its thin‐film form in 2014. It is considered as a promising material for mid‐infrared (MIR) photodetection, due to its intrinsic narrow bandgap, tunable band properties, decent optical absorption, high room‐temperature mobility, and high compatibility with silicon‐based technology. Here, the recent advances in the synthesis techniques, the novel optoelectronic properties, and applications of thin‐film BP flake in MIR photodetection are reviewed. Over 17 synthesis techniques of BP films, as well as their merits and drawbacks, are summarized and discussed. The recently discovered strain‐, electric‐field‐, and chemical‐doping‐induced bandgap tuning effects in BP effectively extend its optical absorption cutoff wavelength into regime with longer wavelength (>4 µm). In addition, the establishment of BP‐based vdW heterostructures paves a new way to design novel high‐performance MIR photodetectors. BP MIR photodetectors enabled by various photocurrent generation mechanisms (photoconductive, photogating, and photovoltaic effect) and device configurations (transistor‐type, waveguide‐coupled, Schottky‐junction‐type, and heterojunction‐type devices) are summarized and compared.
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