掺杂剂
材料科学
兴奋剂
带隙
光探测
光电子学
吸收(声学)
吸收光谱法
光学
光谱学
衰减系数
电离
凝聚态物理
分子物理学
宽禁带半导体
红外光谱学
重整化
谱线
太赫兹光谱与技术
化学物理
吸收率
吸收带
半导体
分析化学(期刊)
作者
Zhao Zhang,Yihan Li,Zhen Li,Siyuan Cheng,Zhe Wang,Mingkun Li,Hao Kong,xin dong
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2026-01-05
卷期号:51 (3): 692-692
摘要
β-Ga2O3 is promising for power and solar-blind UV photodetection due to its wide bandgap, high critical field, and ease of n-type doping with Si. However, a doping limit arises at high Si concentrations, attributed to band-gap narrowing and renormalization caused by dopants and defects. Dopant ionization (via the Franz-Keldysh effect) and defects (via the Urbach effect) both induce band-gap narrowing and alter the absorption coefficient, yet their individual contributions are difficult to decouple from absorption spectra near the bandgap (4.5-5 eV). This study extends analysis to 2-5 eV using machine learning, enabling the separation of each effect's contribution. The resulting metric directly reflects changes induced by doping. This unreported finding clarifies the intrinsic band-gap narrowing mechanism in Si-doped β-Ga2O3 and offers valuable guidance for other n-type doping studies.
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