Reliability assessment of an optical current sensor based on accelerated aging tests

The operational reliability directly affects the practical application of optical current transformers (OCTs) in smart substations. As the key component of the OCT, the reliability of the optical current sensor (OCS) largely determines the reliability level of the OCT. This paper proposes a reliability assessment method of the OCS based on accelerated aging tests. The failure modes and failure mechanisms of the OCS are analyzed, and the concept of OCS insertion loss variation is proposed. An allowable range of insertion loss variation is selected as the failure criterion of the OCS. From the viewpoint of the OCS measurement error generated by the quantization error of the analog-to-digital converter, the allowable range of insertion loss variation is obtained. By selecting a high temperature as the accelerated thermal stress, we design the accelerated aging test scheme of the OCS and analyze the sample test data to obtain the activation energy of the OCS insertion loss failure. Based on this activation energy, the median time to failure and instantaneous failure rate curve of the OCS at normal temperature are obtained. The results indicate that the designed OCS has an expected service life of 50 years and a low instantaneous failure rate at normal temperature. This paper provides basic critical reliability analysis data for the system reliability assessment of OCTs.