Combining Total Internal Reflection Fluorescence Microscopy with Rapid Super-resolution Imaging
作者
Min Guo,Panagiotis Chandris,John Giannini,Jiji Chen,Harshad D. Vishwasrao,Hari Shroff
标识
DOI：10.1364/ntm.2019.nw2c.4
摘要
We combined instant structured illumination microscopy and total internal reflection fluorescence microscopy (instant TIRF-SIM), enabling rapid super-resolution imaging (down to 115±13 nm) at acquisition speeds up to 100 Hz in living samples.
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(2025-6-4)
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