合金
材料科学
电阻率和电导率
铜
生长速度
电导率
枝晶(数学)
晶格常数
增长率
格子(音乐)
平面的
冶金
凝聚态物理
分析化学(期刊)
化学
衍射
几何学
光学
物理化学
色谱法
医学
数学
物理
计算机图形学(图像)
内分泌学
计算机科学
声学
电气工程
工程类
作者
W.-H. Lee,Bok Hyun Kang,K.-Y. Kim,Hyungtae Cho
出处
期刊:Practical Metallography
[De Gruyter]
日期:2013-02-15
卷期号:50 (2): 81-94
摘要
Abstract A Cu–8 %Ag alloy was directionally solidified at different growth velocities to investigate the relationship between the solute distribution and the electrical conductivity of the material. The temperature gradient was fixed at 6.1 K/mm, and the growth rate was varied from 1 µ m/s to 200 µ m/s The planar interface was not observed in this experimental range, although cellular and dendritic interface morphologies were observed. As the growth velocity was increased, the initial silver content decreased, while the silver content near the dendrite boundary increased. The lattice parameter of the Cu – Ag alloy increased with increases in the number of silver sites in the copper lattice as measured via a calculation using the VASP (Vienna Ab-initio Package Simulation) code. The lattice parameter also decreased with increases in the growth velocity due to the decrease in silver content in the matrix. Higher electrical conductivity was obtained with higher growth velocities.
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