CMOS芯片
NMOS逻辑
辐射硬化
修边
炸薯条
像素
光电子学
电气工程
材料科学
辐射
环形振荡器
电压
计算机科学
晶体管
物理
工程类
光学
探测器
操作系统
作者
C. Zhang,J. Hammerich,S. Powell,E. Vilella Figueras,B. Wade
标识
DOI:10.1088/1748-0221/20/01/c01008
摘要
Abstract A monolithic High Voltage CMOS (HV-CMOS) prototype, UKRI-MPW1, has been developed to further improve the radiation tolerance of this technology, which is a promising candidate for future high-energy physics experiments. UKRI-MPW1 addresses the issues of high leakage current and parasitic channels identified in its predecessor, UKRI-MPW0, by incorporating an improved chip ring structure and a custom p-shield layer. Additionally, a new pixel flavour with an NMOS-only trimming Digital-to-Analogue Converter (DAC) further improves pixel performance. This chip has demonstrated a radiation tolerance of up to 3 × 10 15 n eq /cm 2 .
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