光学
干涉测量
像素
断层摄影术
探测器
波前
折射率
光栅扫描
物理
材料科学
作者
Uihan Kim,Hailian Quan,Seung Hyeok Seok,Yongjin Sung,Chulmin Joo
出处
期刊:Optica
[Optica Publishing Group]
日期:2022-08-23
卷期号:9 (9): 1073-1073
被引量:11
标识
DOI:10.1364/optica.464485
摘要
Optical diffraction tomography (ODT) is broadly employed to study 3D structures of transparent objects in a stain-free manner. ODT is commonly implemented with an interferometric setup, but its applications on mesoscopic objects have been challenging due to its limited phase detection range. We introduce an ODT method capable of producing 3D refractive index (RI) distribution via a single-pixel detector. Our method exploits a single-pixel wavefront sensor to measure two-dimensional complex information of millimeter-scale weakly absorbing objects at various projection angles. The application of the Fourier diffraction (or slice) theorem to the acquired complex images results in an RI tomogram of transparent objects. The experiments with calibrated objects and zebrafish larvae demonstrate its promise for measuring the RI tomogram of large and weakly absorbing objects beyond the visible spectral range.
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