Bethe's correction method for dynamical calculation of reflection high-energy electron diffraction intensities from general surfaces

The correction method for weak diffraction of Bethe [Ann. Phys. (Leipzig) (1928), 87, 55-129] is applied to dynamical calculation of reflection high-energy electron diffraction (RHEED) intensities from general surfaces based on a multi-slice method. For high-step-density surfaces, it is shown that the corrected surface potential (Bethe potential) depends on the incident direction of electrons for step directions. Furthermore it is shown that the Bethe potential is approximately proportional to the coverage of adsorbed atoms or of terraces of high-step-density surfaces. For the RHEED intensity from stepped surfaces, the intensity oscillation during molecular beam epitaxial growth is discussed. An appropriate calculational formula for reconstructed surfaces is also obtained.