互调
光电二极管
材料科学
线性
光电子学
三阶
光学
兴奋剂
物理
电气工程
工程类
放大器
CMOS芯片
哲学
神学
作者
Andréas Beling,Houhe Pan,H. Chen,Joe C. Campbell
出处
期刊:Electronics Letters
[Institution of Engineering and Technology]
日期:2008-11-18
卷期号:44 (24): 1419-1420
被引量:18
摘要
Third-order intermodulation distortions of an InGaAs/InP partially depleted absorber photodiode (PDA-PD) using high doping levels for both p-type and n-type absorbers are characterised using a two-tone measurement technique. The third-order local intercept point (IP3) of the device increases only slightly with frequency, and remains as high as 39 dBm up to 20 GHz. The frequency characteristics of the IP3 can be well explained by an equivalent circuit model.
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