X射线光电子能谱
催化作用
铜
脱氢
吸附
无机化学
化学
过渡金属
一氧化碳
氢
化学工程
物理化学
有机化学
工程类
作者
Vijay Kumar Kaushik,Ch. Sivaraj,P. Kanta Rao
标识
DOI:10.1016/0169-4332(91)90059-s
摘要
X-ray photoelectron spectroscopy (XPS) has been used for the characterization of Cu/Al2O3 catalysts used for the dehydrogenation of ethanol and also for carbon monoxide adsorption studies. Various oxidation states of copper in oxidic and hydrogen-reduced catalysts have been identified using Cu(2p32) photoelectron and Cu(LMM) Auger transitions. The Cu(2p3/2)/Al(2p) intensity ratio from XPS data can be correlated with the copper surface area, CO adsorption capacity and reaction rate of the catalyst.
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