钝化
硅
材料科学
纳米技术
光电子学
图层(电子)
作者
Nicholas E. Grant,Alex I. Pointon,Richard Jefferies,Daniel Hiller,Yisong Han,Richard Beanland,Marc Walker,John D. Murphy
出处
期刊:Nanoscale
[The Royal Society of Chemistry]
日期:2020-01-01
卷期号:12 (33): 17332-17341
被引量:32
摘要
The termination of silicon surfaces is studied from the nanometre to the centimetre scale, with differences in behaviour between hydrogen and fluorine terminated surfaces persisting after some subsequent surface passivation treatments.
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