An Introduction to Surface Analysis by XPS and AES
X射线光电子能谱
工程类
化学工程
作者
John F. Watts,John Wolstenholme
标识
DOI:10.1002/0470867930
摘要
Preface. Acknowledgements. Electron Spectroscopy: Some Basic Concepts. Electron Spectrometer Design. The Electron Spectrum: Qualitative and Quantitative Interpretation. Compositional Depth Profiling. Applications of Electron Spectroscopy in Materials Science. Comparison of XPS and AES with Other Analytical Techniques. Glossary. Bibliography.