Direct measurement of the relative Fresnel (Goos-Hänchen) phase by polarization tomography

In this work, we measure the relative Fresnel (Goos-H\"anchen) phase, which is acquired after beam propagation through a two-phase ellipsometric system under total internal reflection, by using polarization tomography. This approach presents a direct measurement which provides a more powerful and complete description of the polarization state. In this sense, the relative phase can be obtained through the polarization-state reconstruction. The experimental data confirm the simulated intensity profiles and allow us to access information about the amplitude and relative phase of the polarization state instead of measuring phase effects.