线性
CMOS芯片
图像传感器
像素
电子工程
炸薯条
点间距
过程(计算)
CMOS传感器
电压
计算机科学
工程类
电气工程
人工智能
操作系统
作者
Fei Wang,Albert Theuwissen
出处
期刊:IS&T International Symposium on Electronic Imaging Science and Technology
[Society for Imaging Science & Technology]
日期:2017-01-29
卷期号:29 (11): 84-90
被引量:35
标识
DOI:10.2352/issn.2470-1173.2017.11.imse-191
摘要
In this paper, we analyze the causes of the nonlinearity of a voltage-mode CMOS image sensor, including a theoretical derivation and a numerical simulation. A prototype chip designed in a 0.18 μm 1-poly 4-metal CMOS process technology is implemented to verify this analysis. The pixel array is 160 × 80 with a pitch of 15 μm, and it contains dozens of groups of pixels that have different design parameters. From the measurement results, we confirmed these factors affecting the linearity and can give guidance for a future design to realize a high linearity CMOS image sensor.
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