材料科学
光电子学
薄脆饼
共发射极
蚀刻(微加工)
干法蚀刻
等离子体刻蚀
氮化镓
二极管
堆栈(抽象数据类型)
纳米技术
图层(电子)
计算机科学
程序设计语言
作者
Qian Fan,Frank Lee,Kameshwar Yadavalli,Michael S. Lee,C. L. Chuang,Hussein S. El‐Ghoroury
摘要
GaN based micro emitter optoelectronic device array has been proved to be the core component for wide variety of applications such as microdisplay, biosensor, projection etc. Etching is one of the key steps to form the GaN micro emitter array device, including inductively coupled plasma (ICP) dry etch and alkaline solution wet etch. This paper reports the recent progress made by Ostendo Technologies Inc in fabricating the ultra-high density, large aspect-ratio etching formed monolithic GaN micro emitter optoelectronic device array. The unit density reaches 1M per cm2, with good uniformity across the whole wafer. Perpendicular etching sidewall was achieved, with smooth surface roughness which is significance feature used for laser diodes (LDs) device.
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