纳米尺度
范德瓦尔斯力
铁电性
异质结
纳米技术
材料科学
比例(比率)
化学物理
凝聚态物理
物理
光电子学
量子力学
电介质
分子
作者
Dengyu Yang,Qingrui Cao,Erin Akyuz,John Hayden,Josh Nordlander,Ian P. Mercer,Muqing Yu,Ranjani Ramachandran,Patrick Irvin,Jon-Paul Maria,Benjamin Hunt,Jeremy Levy
出处
期刊:Nano Letters
[American Chemical Society]
日期:2024-12-13
卷期号:24 (51): 16231-16238
被引量:4
标识
DOI:10.1021/acs.nanolett.4c03574
摘要
We demonstrate an approach to creating nanoscale potentials in van der Waals layers integrated with a buried programmable ferroelectric layer. Using ultra-low-voltage electron beam lithography (ULV-EBL), we can program the ferroelectric polarization in Al1-xBxN (AlBN) thin films, generating structures with sizes as small as 35 nm. We demonstrate the ferroelectric field effect with a graphene/vdW stack on AlBN by creating a p-n junction. This resist-free, high-resolution, contactless patterning method offers a new pathway to integrate ferroelectric films with a wide range of two-dimensional layers including transition-metal dichalcogenides (TMD), enabling arbitrary programming and top-down creation of multifunctional devices.
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